121. Principles of nano-optics
Author: Novotny, Lukas
Library: Central Library and Documentation Center (Semnan)
Subject: ، Nanostructured materials,، Near-field microscopy,، Quantum optics,، Photonics
Classification :
TA
418
.
9N35
N68
2006
122. Principles of nano-optics
Author: / Lukas Novotny, Bert Hecht
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Nanostructured materials.,Near-field microscopy.,Quantum optics.,Photonics.
Classification :
TA
,
418
.
9
,.
N35
,
N68
,
2006
123. Progress in nanoscale characterization and manipulation /
Author: Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai, editors.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electron microscopy.,Nanostructured materials-- Optical properties.,Characterization and Evaluation of Materials.,Nanoscale Science and Technology.,Physics.,Spectroscopy and Microscopy.,Electron microscopy.,Nanostructured materials-- Optical properties.,Nanotechnology.,Science-- Nanostructures.,Science-- Spectroscopy & Spectrum Analysis.,Spectrum analysis, spectrochemistry, mass spectrometry.,Technology & Engineering-- Material Science.,Testing of materials.
Classification :
QH212
.
E4
124. Quantitative microscopy of high temperature materials
Author: edited by A. Strang and J. Cawley.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Materials at high temperatures, Congresses.,Materials-- Creep, Congresses.,Microscopy-- Technique, Congresses.,Microstructure, Congresses.
Classification :
TA418
.
22
.
Q36
2001eb
125. Recent developments in thin film research : epitaxial growth and nanostructures, electron microscopy, and X-ray diffraction : Proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and Proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
Author: ]G. Ritter ... et al., editors[
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Thin films, Epitaxy, Nanostructure materials, Electron microscopy, X-rays - Diffraction
Classification :
TA
418
.
9
.
T45
S94
1997
126. Recent developments in thin film research :epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
Author: ]G. Ritter ... et al., editors[
Library: Library of College of Science University of Tehran (Tehran)
Subject: ، Thin films,، Epitaxy,، Nanostructured materials,، Electron microscopy,Diffraction ، X-rays
Classification :
TA
418
.
9
.
T45
S94
1997
127. Recent developments in thin film research: epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction: proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
Author:
Library: Central Library of Sharif University of Technology (Tehran)
Subject: Congresses ، Thin films,Congresses ، Epitaxy,Congresses ، Nanostructure materials,Congresses ، Electron microscopy,Congresses ، X-rays-- Diffraction
Classification :
TA
418
.
9
.
T45
.
S94
1997
128. Reflection electron microscopy and spectroscopy for surface analysis /
Author: Zhong Lin Wang.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Materials-- Microscopy.,Reflection electron microscopy.,Surfaces (Technology)-- Analysis.,Materials-- Microscopy.,Reflection electron microscopy.,Surfaces (Technology)-- Analysis.
Classification :
TA417
.
23
.
W36
1996
129. SEM: a users manual for materials science
Author: / By B. Gabriel
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Microscope and microscopy,Electron microscope,Scanning electron microscopes,Structured materials
Classification :
TA417
.
23
.
G28
1985
130. Scanning Electron Microscopy and X-Ray Microanalysis /
Author: by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.,Biological Microscopy.,Characterization and Evaluation of Materials.,Materials science.,Materials Science.,Measurement Science and Instrumentation.,Measurement.,Microscopy.,Physical measurements.,Spectroscopy and Microscopy.,Spectroscopy.,Spectroscopy/Spectrometry.,Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.
Classification :
TA404
.
6
131. Scanning Probe Microscopy
Author:
Library: Central Library and Documents Center of Mazandaran University (Mazandaran)
Subject: xA0;. ; Condensed matter. ; Spectroscopy and Microscopy. ; &xA0; &xA0; &Surfaces. ; Thin films. ; Materials science. ; Physical measurements. ; Measurement-Spectroscopy. ; Microscopy. ; Materials
132. Scanning probe microscopy: characterization, nanofabrication and device application of functional materials
Author: edited by Paula Maria Vilarinho, Yossi Rosenwaks and Angus Kingon
Library: (Semnan)
Subject: Congresses ، Materials- Microscopy,Congresses ، Scanning probe microscopy
Classification :
TA
417
.
23
.
S33
133. Scanning probe microscopy: characterization, nanofabrication and device application of functional materials
Author:
Library: Central Library of Sharif University of Technology (Tehran)
Subject: Congresses ، Materials-- Microscopy,Congresses ، Scanning probe microscopy
Classification :
TA
417
.
23
.
N384
2002
134. Scanning probe microscopy for industrial applications :
Author: edited by Dalia G. Yablon.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Materials-- Microscopy.,Scanning probe microscopy-- Industrial applications.
135. Scanning probe microscopy for industrial applications :
Author: edited by Dalia G. Yablon.
Library: Central Library and Documents Center of Tehran University (Tehran)
Subject: Materials-- Microscopy.,Scanning probe microscopy-- Industrial applications.,TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS.
Classification :
TA417
.
23
.
S33
2014
136. Scanning probe microscopy for industrial applications
Author: / edited by Dalia G. Yablon
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Materials--Microscopy,Scanning probe microscopy--Industrial applications
Classification :
TA417
.
23
.
S33
2014
137. Scanning probe microscopy in nanoscience and nanotechnology
پدیدآورنده :
موضوع : ، Scanning probe microscopy.,Microscopy ، Nanostrutured materials
۴ نسخه از این کتاب در ۴ کتابخانه موجود است.
138. Scanning probe microscopy in nanoscience and nanotechnology
Author: / edited by Bharat Bhushan
Library: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
Subject: Scanning probe microscopy,Nanostructured materials - Microscopy
Classification :
QH212
S33S383
2011
139. Scanning probe microscopy in nanoscience and nanotechnology
Author: / Bharat Bhushan, editor
Library: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
Subject: Scanning probe microscopy,Nanostructured materials--Microscopy
Classification :
QH212
.
S33S383
2010
140. Scanning probe microscopy in nanoscience and nanotechnology
Author: / edited by Bharat Bhushan
Library: Central Library and Archive Center of shahid Beheshti University (Tehran)
Subject: Scanning probe microscopy,Nanostructured materials,-- Microscopy
Classification :
620
.
11299
S283
2010
